Cryogenic probe station for use in automated microwave and noise figure measurements
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Cryogenic probe station for use in automated microwave and noise figure measurements

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Published by National Aeronautics and Space Administration, National Technical Information Service, distributor in [Washington, DC], [Springfield, Va .
Written in English

Subjects:

  • Low temperature research.

Book details:

Edition Notes

StatementSusan R. Taub ... [et al.].
SeriesNASA technical memorandum -- 106560., NASA technical memorandum -- 106560.
ContributionsTaub, Susan R., United States. National Aeronautics and Space Administration.
The Physical Object
FormatMicroform
Pagination1 v.
ID Numbers
Open LibraryOL14666709M

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Low-temperature microwave measurements of both lattice-matched and pseudomorphic In/sub x/Ga/sub 1-x/As/In/sub /As (x=, , and ) channel MODFETs on . A cryogenic measurement system capable of performing on-wafer RF testing of semiconductor devices and circuits has been developed. This -CryoProbe Station- can wafer probe devices and circuits at cryogenic temperatures, thus eliminating the need for wire bonds. The system operates under vacuum created by a sorption pump. It uses an open cycle cooling system that can be cooled with either.   A cryogenic measurement system capable of performing on-wafer RF testing of semiconductor devices and circuits has been developed. This 'CryoProbe Station' can wafer-probe devices and circuits at cryogenic temperatures, thus eliminating the need for wire bonds. The system operates under vacuum created by a sorption pump. It uses an open cycle cooling system that can be Cited by: 1. Get this from a library! Cryogenic probe station for use in automated microwave and noise figure measurements. [Susan R Taub; United States. National Aeronautics and Space Administration.;].

Cryogenic probe station for use in automated microwave and noise figure measurements A cryogenic measurement system capable of performing on-wafer RF testing of semiconductor devices and circuits has been developed. This 'CryoProbe Station' can wafer-probe devices and circuits at cryogenic temperatures, thus eliminating the need for wire bonds. Cryogenic probe station for use in automated microwave and noise figure measurements. By Samuel A. Alterovitz, Robert R. Romanofsky, Paul G. Young, Ben T. Ebihara and Susan R. Taub. Abstract. A cryogenic measurement system capable of performing on-wafer RF testing of semiconductor devices and circuits has been developed. This 'CryoProbe. Cryogenic Probe Station. The MDC Model Cryogenic Probe Station is a cost effective alternative to high-priced vacuum based cryogenic probe stations. With up to five probes available and sample diameters up to six inches, the MDC Cryogenic Probe Station allows for electrical measurements at temperatures near liquid nitrogen levels (77K). High-temperature probe station for use in microwave device characterization through °C Cryogenic Probe Station for Use in Automated Microwave and Noise Figure Measurements .

probe station, shown in Figure 1. Its capabilities are summa-rized in Table I and are demonstrated in Sec. III, where noise temperature and S-parameter measurements are presented for a W-band low noise amplifier (LNA). Sec. IV discusses fur-ther improvements to the station. II. DESIGN Commercial cryogenic probe stations commonly employ. Maury cryogenic terminations are liquid nitrogen cooled loads which provide accurately known noise power at a well matched output port.. Used with ambient and/or heated terminations and a noise figure meter, these terminations provide cold reference temperatures needed for highly accurate noise figure or effective input noise temperature. cryogenic probe stations offers numerous environmental and probing choices to meet the diverse application needs of researchers. From general purpose units to specialized platforms, each probe station is carefully designed to ensure stable operation and dependable measurements from cryogenic temperatures all the way through the operating range. The ARS manufactured PS-CC Closed Cycle Cryogenic Probe Station provides a high vacuum cryogenic environment of up to Probe Station features up to eight probes with 1 μm sensitivity, 2 inch measurement area.